Power Device Test
Power semiconductor devices are the core devices of energy conversion. Whatever MOSFET or IGBT, each plays an important role in the regulation of electric energy. The loss of the power device itself is an important factor in affecting the overall efficiency of the power supply. The high loss will cause the device to heat up and may affect the service life of the power supply. The oscilloscopes generally use a transient power integration method to measure the loss waveform of a power device. RIGOL oscilloscopes support power testing. The high-voltage differential and current probes equipped with the oscilloscopes can meet a wide range of testing needs. The UltraPower Analysis PC software allows you to export test data, complete online and offline tests of multiple parameters, and generate reports.
Power ripple is an important parameter to evaluate DC power supply. The ripple and noise consist of rectified main ripple, switching noise, PWM frequency ripple, and random noise. To make an accurate testing of ripples, it is required that the ripple of the test instrument itself is as low as possible and the test system has a minimal impact on the test results. One of the important features of RIGOL's oscilloscopes is its low noise floor. The DS2000A oscilloscope offers the industry's leading small range of 500 uV/div, making it ideal for testing small signals such as power ripple. The PVP2150/PVP2350 probe offers a 1:1/10:1 attenuation ratio. The 1X probe ratio can provide up to 35 MHz of bandwidth for direct ripple testing. UltraPower Analysis software provides ripple analysis function modules.
In order to improve the efficiency of the power supply, the switch power supply is mostly used to adjust the power factor of the FPC circuit, the gate drive pulse adjustable. In variable frequency drive systems, bipolar PWM drive pulses also need to be simulated, tested and validated. RIGOL's various arbitrary waveform generators can produce a variety of pulse-width modulation signals, and when the two-channel output is completely isolated between channels, it is particularly suitable for the analog generation of various types of drive signals. The measuring trend mapping function of the oscilloscope can analyze the variation of the modulated signal.
Production And Aging Test
Power products require a large number of rapid parameter tests and aging tests, which must simultaneously test the measurement and recording of multiple parameters. For test results that exceed the limit, the system requires an alarm prompt. All these requirements can be easily completed by RIGOL's M300 data acquisition system. The 6½-digit DMM has high accuracy, with the test speed of up to 250CH/s and the system configuration capability of up to 320 channels, making M300 an ideal tool for production tests as well as temperature, humidity and aging test. Large-screen display and PC software make it easy to use and make configurations.